Technologies by David Reid
Metasurface Enables Rapid, Sensitive, and Low-Cost Permittivity Characterization of Dielectric Materials at Radio Frequencies

Current permittivity measurement techniques either lack precision or are costly

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Versatile Retroreflective Metastructures for Enhanced Electromagnetic Response
Provides improved bandwidth and angular range at near-grazing angles
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Electromagnetic (EM) Metastructures
For structural and electromagnetic uses in radome structures
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