Georgia Tech researchers have developed a variable interconnect geometry formed on a substrate that allows for increased electrical performance of the interconnects without compromising mechanical reliability. The compliance of the interconnects varies from the center of the substrate to edges of the substrate. The variation in compliance can either be step-wise or continuous. Exemplary low-compliance interconnects include columnar interconnects and exemplary high-compliance interconnects include helix interconnects. A cost-effective implementation using batch fabrication of the interconnects at a wafer level through sequential lithography and electroplating processes may be employed.
- Enhanced electrical performance without decrease mechanical reliability
- Effective power distribution design and thermal management
- Cost effective
- Microprocessor performance
- Software development
- Computer design
Conventional electronic packages typically include interconnects that are nearly identical in shape and size from the center to the edge. The choice of the interconnect design is such that the interconnect at the furthest distance from the center of the die, where the differential displacement between the die and the substrate due to CTE mismatch is maximum, has sufficient fatigue life and will not delaminate or crack the low-K dielectric in the die. It would be desirable to have improved packaging techniques and methods and utilize a step wise or continuous variation of interconnect geometry in an electronic package. This would improve the electrical performance of electronic packages without compromising on mechanical reliability.